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Selectable Orientation Bent Tip Calibration-Free Probe
专利权人:
Robert Van Vorhis
发明人:
Robert Van Vorhis
申请号:
US13313527
公开号:
US20130150708A1
申请日:
2011.12.07
申请国别(地区):
US
年份:
2013
代理人:
摘要:
A probe is provided. The probe may include a shaft portion rotatably attachable to a position sensing device, a nonlinear portion at least partially removed from a center axis of the shaft portion, and a tip disposed at a distal end of the nonlinear portion and positioned on the center axis. The nonlinear portion may be selectably rotatable about the center axis to one of a plurality of rotational orientations. The tip may have a substantially constant position relative to the position sensing device.
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