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IMPEDANCE MEASUREMENT PROCESS
专利权人:
发明人:
申请号:
EP09828450.8
公开号:
EP2348987B1
申请日:
2009.11.27
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
Apparatus for use in performing impedance measurements on a subject, the apparatus including a probe having a plurality of electrodes, the probe being configured to allow at least some of the electrodes to be in contact with at least part of the subject and a processing system for, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration and determining an indicator indicative of the presence, absence or degree of an anomaly using the first and second impedance values.
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