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Impedance Measurement Process
专利权人:
发明人:
Bruce Herbert CORNISH,Brian John THOMAS,Jye Geoffrey SMITH
申请号:
US14963018
公开号:
US20160089051A1
申请日:
2015.12.08
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
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