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IMPEDANCE MEASUREMENT PROCESS
专利权人:
IMPEDIMED LIMITED
发明人:
CORNISH, BRUCE HERBERT,THOMAS, BRIAN JOHN,SMITH, JYE GEOFFREY
申请号:
EP08782894
公开号:
EP2175776A4
申请日:
2008.08.07
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
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