Methods, systems, and devices for electrode capacitance calculation and application

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专利权人:

发明人:

Wayne A. Morgan

申请号：

US15141021

公开号：

US09970893B2

申请日:

2016.04.28

申请国别(地区):

US

年份:

2018

代理人:

摘要：

The double layer capacitance of a working electrode of a sensor may be measured with minimal disruption to the sensor equilibrium by open circuiting the working electrode and measuring the voltage drift on a periodic, or as-needed, basis. The values of the double layer capacitance may be monitored over time to determine, e.g., sensor age and condition.

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