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METHOD AND APPARATUS FOR PROCESSING PHOTON-COUNTING X-RAY DETECTION DATA AND X-RAY APPARATUS
专利权人:
JOB CORPORATION
发明人:
Tsutomu YAMAKAWA,Shuichiro YAMAMOTO,Masahiro OKADA
申请号:
US16627451
公开号:
US20200249179A1
申请日:
2018.10.26
申请国别(地区):
US
年份:
2020
代理人:
摘要:
A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Zeff, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (ZHigh, ZLow) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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