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DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS
专利权人:
发明人:
스텃먼, 단,핀켄탈, 마이클
申请号:
KR1020147005431
公开号:
KR1014826990000B1
申请日:
2012.06.11
申请国别(地区):
KR
年份:
2015
代理人:
摘要:
A differential phase contrast X-ray imaging system (100) includes an X-ray illumination system (102), a beam splitter (104) arranged in an optical path (106) of the X-ray illumination system (102), and a detection system (108) arranged in an optical path (110) to detect X-rays after passing through the beam splitter (104). The X-ray imaging system (100) uses the Talbot-Lau interferometric configuration where the beam splitter (102) acts as a phase grating and the analyser grating has reflective strips parallel to the incident X-ray beam, said gratings being used both in glancing / grazing incidence.미분 위상 대조 X선 이미징 시스템은 X선 일루미네이션 시스템, 상기 X선 일루미네이션 시스템의 광학 패스에 배치된 빔 스플리터, 및 상기 빔 스플리터를 통해서 통과한 X선을 검출하기 위해 광학 패스에 배치되는 검출 시스템을 포함한다.
来源网站:
中国工程科技知识中心
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