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Method for analyzing the structure of an electrically conductive object
专利权人:
Wang; Wei
发明人:
Wang, Wei
申请号:
DK08775751
公开号:
DK2152156T3
申请日:
2008.06.06
申请国别(地区):
DK
年份:
2017
代理人:
摘要:
A method for analyzing the structure of an electrically conductive object, the method comprising the steps of: (i) obtaining electrical impedance data for the object over a range of frequencies; (ii) analyzing the obtained electrical impedance data using a transfer function of an assumed electrical model to determine a plurality of electrical impedance properties for the object; (iii) constructively combining selected ones of the determined plurality of electrical impedance properties to provide at least one parametric impedance value for the object; and (iii) imaging one or more of the determined parametric impedance values.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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