您的位置: 首页 > 农业专利 > 详情页

Semiconductor X-ray detector
专利权人:
SHENZHEN XPECTVISION TECHNOLOGY CO.; LTD.
发明人:
Peiyan Cao,Yurun Liu
申请号:
US15866928
公开号:
US10502843B2
申请日:
2018.01.10
申请国别(地区):
US
年份:
2019
代理人:
摘要:
Disclosed herein is an apparatus suitable for detecting X-ray, comprising: an X-ray absorption layer comprising an electrode; an electronics layer, the electronics layer comprising: a substrate having a first surface and a second surface, an electronics system in or on the substrate, an electric contact on the first surface, a via, and a transmission line on the second surface; wherein the via extends from the first surface to the second surface; wherein the electrode is electrically connected to the electric contact; wherein the electronics system is electrically connected to the electric contact and the transmission line through the via.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充