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Methods of Making Semiconductor X-Ray Detector
专利权人:
LTD.;SHENZHEN XPECTVISION TECHNOLOGY CO.
发明人:
Peiyan CAO,Chongshen SONG,Yurun LIU
申请号:
US16185370
公开号:
US20190096950A1
申请日:
2018.11.09
申请国别(地区):
US
年份:
2019
代理人:
摘要:
Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.
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中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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