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Automated Cephalometric Analysis Using Machine Learning
专利权人:
发明人:
Zeev Abraham,Daniel Abraham
申请号:
US15250284
公开号:
US20180061054A1
申请日:
2016.08.29
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A system and method are described for automating the analysis of cephalometric x-rays. Included in the analysis is a method for automatic anatomical landmark localization based on convolutional neural networks. In an aspect, the system and method employ a deep database of images and/or prior image analysis results so as to improve the outcome from the present automated landmark detection scheme.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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