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Leaf area index measurement system, device, method, and program
专利权人:
Masato Tsukada
发明人:
Masato Tsukada
申请号:
US13824555
公开号:
US09202134B2
申请日:
2011.12.02
申请国别(地区):
US
年份:
2015
代理人:
摘要:
A leaf area index measurement system includes: a reflector placed in a neighborhood of a measurement target plant; imaging means placed at a position where no obstacle is present between the imaging means and the reflector, and for capturing an image of the reflector and outputting the captured image; intensity calculation means for calculating an intensity of light reflected by the reflector, based on the captured image output from the imaging means; and leaf area index calculation means for calculating a leaf area index, based on the intensity of light calculated by the intensity calculation means.
来源网站:
中国工程科技知识中心
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