ANDRIY YAROSHENKO,HANNS-INGO MAACK,THOMAS KOEHLER,FABIO DE MARCO,LUCAS BENEDICT GROMANN,WILLER KONSTANTIN,PETER NOEL
申请号：
US16606418
公开号：
US20200187893A1
申请日:
2018.04.17
申请国别(地区):
US
年份:
2020
代理人:
摘要：
The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.
