METHOD AND APPARATUS FOR MEASURING INFLORESCENCE, SEED AND/OR SEED YIELD PHENOTYPE

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专利权人:

Basf Plant Science Company GmbH

发明人:

LEJEUNE, Pierre,BAERT, Jeroen,LEYNS, Frederik,EECKHOUT, Joris

申请号：

EP20160809735

公开号：

EP3387416(A1)

申请日:

2016.12.06

申请国别(地区):

欧洲专利局

年份:

2018

代理人:

摘要：

The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/