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APPARATUS AND METHOD OF MEASURING STRESS
专利权人:
发明人:
Joonhyung LEE,Sangkyu KIM,Seongho CHO
申请号:
US14792674
公开号:
US20160051175A1
申请日:
2015.07.07
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Provided is an apparatus and method of measuring stress. The apparatus includes: a light source configured to emit light to the subject a sensor configured to measure light reflected from the subject a data extractor configured to obtain, from the reflected light, data that indicates at least one object material included in the subject and a data processor configured to generate information about the stress of the subject based on a correlation between the obtained data and a reference value of stress.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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