A temperature drift compensation apparatus (1) and method for measuring micro signals. The apparatus (1) comprises a first differential amplifier (11), a second differential amplifier (12), a third differential amplifier (13), an ADC amplification chip (14), and a single chip microcomputer (15). The first differential amplifier (11) performs differential calculation and amplification on a first micro signal and a second micro signal to obtain a first differential signal. The second differential amplifier (12) performs differential calculation and amplification on a third micro signal and a fourth micro signal to obtain a second differential signal. The third differential amplifier (13) performs differential calculation and amplification on the first differential signal and the second differential signal to obtain a measurement feature signal. The ADC amplification chip (14) amplifies the measurement feature signal and then outputs the amplified measurement feature signal to the single chip microcomputer (15). The product of a temperature coefficient of the first differential amplifier (11) and a temperature coefficient of the third differential amplifier (13) is equal in value but opposite in sign to a temperature coefficient of an amplification circuit chip (141). The apparatus (1) and method can eliminate interference with micro signals caused by temperature drift generated by a measurement circuit, and improve the accuracy of measurement of the micro signals.Linvention concerne un appareil de compensation de dérive de température (1) et un procédé de mesure de micro-signaux. Lappareil (1) comprend un premier amplificateur différentiel (11), un deuxième amplificateur différentiel (12), un troisième amplificateur différentiel (13), une puce damplification de CAN (14), et un micro-ordinateur monopuce (15). Le premier amplificateur différentiel (11) met en oeuvre un calcul différentiel et une amplification sur un premier micro-signal et un second micro-signal pour ob
