A detection system comprises a detection device and a detection test piece, the detection device comprises a light-emitting unit, a photoelectric sensor, a storage unit and a processing unit.The processing unit controls the light-emitting unit to send a first light beam to the test piece, so that the photoelectric sensor receives a second light beam from the test piece to generate a corresponding induction electric signal.The processing unit receives the inductive signal and sets the comparison data of multiple signals stored in the storage unit in accordance with the signal size of the inductive signal as a target signal data, and sets the detection procedure corresponding to the target signal data as a target procedure. The processing unit executes the target procedure to inspect the test piece Measurement.一種檢測系統包含一檢測裝置及一檢測試片，該檢測裝置包含一發光單元、一光電感測器、一儲存單元，及一處理單元。該處理單元控制該發光單元對該檢測試片發出一第一光束，進而使得該光電感測器接收來自該檢測試片的一第二光束，以產生對應的一感應電訊號。該處理單元接收該感應電訊號，並將該儲存單元所儲存的多個電訊號對照資料之其中與該感應電訊號的訊號大小相符合者，設定為一目標電訊號資料，並將該目標電訊號資料所對應的該檢測程序設定為一目標程序，該處理單元執行該目標程序以對該檢測試片進行檢測。
