RYDING, Geoffrey,SAKASE, Takao,PARK, William, H.,SMICK, Theodore, H.
申请号：
EP17796603
公开号：
EP3456159A4
申请日:
2017.05.05
申请国别(地区):
EP
年份:
2019
代理人:
摘要：
The present disclosures relates to an ion beam assembly where a relatively small deflection angle (approximately 15° from the center of the beam line) is used in conjunction with two beam dumps located on either side of the beam. In some embodiments, the combination of the two beam dumps and the magnet assembly can provide an ion beam filter. In some embodiments, the resulting system provides a smaller, safer and more reliable ion beam. In some embodiments, the ion beam can be a proton beam.
