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TEST STRUCTURES AND METROLOGY TECHNIQUE UTILIZING THE TEST STRUCTURES FOR MEASURING IN PATTERNED STRUCTURES
专利权人:
NOVA MEASURING INSTRUMENTS LTD.
发明人:
TUROVETS Igor
申请号:
US201515124445
公开号:
US2017023357(A1)
申请日:
2015.03.10
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
An article is presented configured for controlling a multiple patterning process, such as a spacer self-aligned multiple patterning, to produce a target pattern. The article comprises a test site carrying a test structure comprising at least one pair of gratings, wherein first and second gratings of the pair are in the form of first and second patterns of alternating features and spaces and differ from the target pattern by respectively different first and second values which are selected to provide together a total difference such that a differential optical response from the test structure is indicative of a pitch walking effect.
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