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METHOD AND DEVICE FOR DETERMINING THE X-RAY RADIATION ATTENUATION CAUSED BY THE OBJECT TO BE EXAMINED
专利权人:
Siemens Aktiengesellschaft
发明人:
Thilo Hannemann,Mario Reinwand
申请号:
US14420752
公开号:
US20150219774A1
申请日:
2013.07.18
申请国别(地区):
US
年份:
2015
代理人:
摘要:
An embodiment of the invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object. Another aspect of an embodiment of the invention is a device, particularly a radiation monitor for an X-ray or CT system, which is suitable for performing the aforementioned procedure according to an embodiment of the invention.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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