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X-RAY INTERFEROMETRIC IMAGING SYSTEM
专利权人:
Sigray Inc.
发明人:
LEWIS, Sylvia Jia Yun,YUN, Wenbing,KIRZ, Janos
申请号:
EP15786098
公开号:
EP3136970A4
申请日:
2015.04.30
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.
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中国工程科技知识中心
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