Leonard John Otten, III,Paul Harrison,Desirae L. Cuevas,Paul Fournier
申请号：
US12536333
公开号：
US08882274B1
申请日:
2009.08.05
申请国别(地区):
US
年份:
2014
代理人:
摘要：
The device and method of the present invention are useful for determining the characteristics of an infrared wavefront. The present invention involves positioning a beam of light containing the infrared wavefront to be characterized onto a distorted grating, using the grating to produce a plurality of images, determining the infrared wavefront from the plurality of images and analyzing the infrared wavefront for features that characterize the infrared wavefront.
