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X-RAY MULTIGRAIN CRYSTALLOGRAPHY
专利权人:
Xnovo Technology ApS
发明人:
Wejdemann Christian,Poulsen Henning Friis,Lauridsen Erik Mejdal,Reischig Peter
申请号:
US201615228868
公开号:
US2017038317(A1)
申请日:
2016.08.04
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors . The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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