POLARIZATION-SENSITIVE SPECTRAL INTERFEROMETRY

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专利权人:

发明人:

Thomas E. Milner,Nathaniel J. KEMP,Eunha KIM

申请号：

US15244210

公开号：

US20170045349A1

申请日:

2016.08.23

申请国别(地区):

US

年份:

2017

代理人:

摘要：

A polarization sensitive spectral interferometer apparatus and method for analyzing a sample by optical energy reflected from the sample. The polarization sensitive spectral interferometer apparatus and method determines polarization properties of the sample by optical energy reflected from the sample.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/