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IMPEDANCE MEASURING DEVICE
专利权人:
发明人:
Jung Jin HWANG,Young Dae SEO
申请号:
US15302596
公开号:
US20180116545A1
申请日:
2015.11.09
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The present invention relates to an impedance measuring device obtaining impedance of portions of an object corresponding to two sensing electrodes by detecting, through the two sensing electrodes, an electrical variation shown on the object as an electrical signal is applied. A detector amplifying each of signals detected through the two sensing electrodes and then differential-operating the amplified signals to generate a signal for obtaining impedance is subjected to a calibration process for adjusting the gain of the amplifiers to reduce in-phase noise added due to an imbalance between the sensing electrodes.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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