Institute of Nuclear Energy Research; Atomic Energy Council; Executive Yuan; R.O.C.
发明人:
MEEI-LING JAN,Sheng-Pin Tseng,Chia-Hao Chang
申请号：
US15596467
公开号：
US20180116622A1
申请日:
2017.05.16
申请国别(地区):
US
年份:
2018
代理人:
摘要：
The invention provides an automatic exposure control method for a digital X-ray imaging device. The automatic exposure control method for a digital X-ray imaging device includes the following the steps. First, a parameter database is provided before imaging scan. A depth information is generated, wherein the depth information by a depth sensor detect the thickness of a region of interest of an object. Imaging exposure parameters, mAs and kV, are estimated according to the depth information and the parameter database. Then, X-ray imaging is performed according to the imaging exposure parameters estimated by the method described in this application. In addition, an automatic exposure control system for a digital X-ray imaging device is also provided.
