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METHOD FOR DETECTING AND LOCALIZING INSULATION FAILURES OF IMPLANTABLE DEVICE LEADS
专利权人:
Mark William Kroll;Charles Dennis Swerdlow
发明人:
Mark William Kroll,Charles Dennis Swerdlow
申请号:
US13833477
公开号:
US20130325079A1
申请日:
2013.03.15
申请国别(地区):
US
年份:
2013
代理人:
摘要:
The invention relates to a method and apparatus for diagnosis of conductor anomalies, such as insulation failures, in an implantable medical device, such as an implantable cardioverter defibrillator (ICD), a pacemaker, or a neurostimulator. Insulation failures are detected and localized by identifying changes in electrical fields via surface (skin) potentials. Small variations in potential are detected along the course of the electrode near the site of insulation failure.
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