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Robust One-Shot Interferometer and OCT Method for Material Measurement and Tumor Cell Recognition
专利权人:
发明人:
Klaus Koerner,Wolfgang Osten
申请号:
US14476301
公开号:
US20150077760A1
申请日:
2014.09.03
申请国别(地区):
US
年份:
2015
代理人:
摘要:
Disclosed are methods and an assembly for robust one-shot interferometry, in particular for optical coherence tomography according to the spatial domain approach (SD-OCT) and/or according to the light-field approach. In one embodiment, the method and the assembly may be used for measurements on material and living tissue, for distance measurement, for 2D or 3D measurement with a finely structured light source imaged onto the object in a diffraction-limited way, or with spots thereof.The assembly may comprise an interferometer having object and reference arms and a detector for electromagnetic radiation. In other embodiments, during a detection process, a plurality of spatial interferograms may be formed by making an inclined and/or curved reference wavefront interfere with an object wavefront for each measurement point. The resulting spatial interferograms may be detected in a single detector frame and may be further evaluated via a computer program.
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