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DISPOSITIF D'INSPECTION D'IMAGE, PROCÉDÉ D'INSPECTION D'IMAGE ET COMPOSANT DE DISPOSITIF D'INSPECTION D'IMAGE
专利权人:
QD Laser; Inc.
发明人:
MORINO, Seiji,SUZUKI, Makoto,ISHIMOTO, Manabu
申请号:
EP17841406
公开号:
EP3502647A4
申请日:
2017.08.07
申请国别(地区):
EP
年份:
2019
代理人:
摘要:
An image inspection device includes: a mounting unit 10 on which an image projection device 30 that directly projects an image on a retina of a user is to be mounted; a condensing lens 12 configured to condense a light beam 50 emitted from the image projection device 30 mounted on the mounting unit 10; and a target projection unit 14 on which an inspection image is to be projected by irradiation with the light beam 50 condensed by the condensing lens 12; and an inspection unit 22 configured to inspect the inspection image projected on the target projection unit 14.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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