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OPHTHALMOLOGICAL DEVICE AND OPHTHALMOLOGICAL INSPECTION SYSTEM
专利权人:
TOPCON CORPORATION
发明人:
Takefumi HAYASHI,Kouta FUJII
申请号:
US16686245
公开号:
US20200077888A1
申请日:
2019.11.18
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An ophthalmological device according to the embodiments comprises an objective lens, a subjective inspection optical system, and an interference optical system. The subjective inspection optical system includes an optical element capable of correcting aberration of a subject's eye and projects a visual target onto the subject's eye via the objective lens and the optical element. The interference optical system splits light from a light source into reference light and measurement light, projects the measurement light onto the subject's eye via the objective lens and the optical element, generates interference light between returning light of the measurement light and the reference light, and detects the generated interference light.
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