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眼底検査装置
专利权人:
株式会社ニデック
发明人:
小林 利哉,南原 孝啓
申请号:
JP2012123939
公开号:
JP6060525B2
申请日:
2012.05.31
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a fundus examination apparatus capable of accurately executing visual field examination of fundi.SOLUTION: A fundus examination apparatus is used to examine fundi by projecting an examination visual target on an examination position of the fundus. The apparatus includes: an examination visual target setting means which sets an examination position on the fundus and projecting conditions of an examination visual target at the examination position and which sets the projecting conditions of the examination visual target at the set examination position on the basis of the previously set conditions in order to change the projecting range of the examination visual target in accordance with the examination position on the fundus while considering a change in cell density concerning to the visual function with human eyes between the center of the fundus and the periphery and a visual target projecting optical system which can project on the fundus, an examination visual target corresponding to the examination position and the projecting conditions which are set by the examination visual target setting means.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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