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X-ray calibration device
专利权人:
发明人:
申请号:
EP12186419.3
公开号:
EP2578155A1
申请日:
2012.09.27
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
An x-ray calibration device (300) includes a core (302) including a first material with a first x-ray attenuation coefficient. The core (302) defines a cavity (306) that is configured to receive a plug of a different x-ray attenuation coefficient in order to alter the x-ray attenuation coefficient of the x-ray calibration device (300). The x-ray calibration device (300) also includes an outer layer (304) at least partially surrounding the core (302). The outer layer (304) includes a second material with a second x-ray attenuation coefficient, where the second x-ray attenuation coefficient is lower than the first x-ray attenuation coefficient.
来源网站:
中国工程科技知识中心
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