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Determining changes in the x-ray emission yield of an x-ray source
专利权人:
Martin Kimutai Duerr;Rainer Kiewitt;Hans Peter Sprong
发明人:
Hans Peter Sprong,Martin Kimutai Duerr,Rainer Kiewitt
申请号:
US13883291
公开号:
US09370084B2
申请日:
2011.11.02
申请国别(地区):
US
年份:
2016
代理人:
摘要:
The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (16). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier (24) is provided with an aperture (26) for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation (30) with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X-ray sensor can be positioned inside the beam formation (30), but outside the “actual field of view” (40) as determined by a diaphragm (36).
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