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PARTICLE IMAGE ANALYSIS METHOD AND DEVICE
专利权人:
Hitachi High-Technologies Corporation
发明人:
TAKI, Miki,OOWADA, Norio
申请号:
EP20090758198
公开号:
EP2290350(B1)
申请日:
2009.05.12
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
Realized is a particle image analyzing method adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an entire imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses the operating unit 60 to modify positions of the particles to those of correct component items (Step 101). Next, an overall image of the imaging region is displayed and if any components to be added (overlooked components) are appearing, the kinds of these components are identified and quantitative data on each kind of component is registered (Steps 102 and 103). Upon completion of the registration, the concentration of the sample is recalculated by an arithmetic processor 283 (Step 104). Finally,
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