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METHOD AND DEVICE FOR VISUALIZING DISTRIBUTION OF LOCAL ELECTRIC FIELD
专利权人:
Japan Science and Technology Agency
发明人:
FUJITA, Jun-ichi
申请号:
EP20090720348
公开号:
EP2259051(B1)
申请日:
2009.03.13
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
A method which visualizes the distribution of a local electric field formed near a sample 2 is disclosed. A primary electron beam 1 which passes through the local electric field formed near the sample 2 is deflected by the local electric field, secondary electrons which are generated and emitted from a detection element provided downstream of an orbit of the deflected primary electron beam 1 are detected by a secondary electron detector 6, and an image formed based on the detected signal and a scanning electron beam image obtained by scanning the sample 2 are synthesized thus visualizing the distribution of the local electric field in multiple tones. Due to such an operation, it is possible to provide a method for visualizing the distribution of a local electric field in which the distribution of a local electric field can be obtained in multiple tone and in real time by performing image scanning one time using a usual electron beam scanning optical system.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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