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MODULAR OPTICAL INSPECTION STATION
专利权人:
Instrumental, Inc.
发明人:
Weiss Samuel Bruce,Shedletsky Anna-Katrina
申请号:
US201715653040
公开号:
US2018130197(A1)
申请日:
2017.07.18
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-field lighting module adjacent and perpendicular to the nest module and including a dark-field light source configured to output light across a light plane and a directional light filter configured to pass light output by the dark-field light source normal to the light plane and to reject light output by the dark-field light source substantially nonparallel to the light plane; and a bright-field light source proximal the optical sensor and configured to output light toward the surface of interest.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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