Xue Rui,Mingye Wu,Yannan Jin,Peter Michael Edic,Bruno Kristiaan Bernard De Man
申请号：
US16782584
公开号：
US20200170599A1
申请日:
2020.02.05
申请国别(地区):
US
年份:
2020
代理人:
摘要：
A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials； obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object； estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity； and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
