光断層画像測定装置
- 专利权人:
- コニカミノルタ株式会社
- 发明人:
- 長井 史生
- 申请号：
- JP2008278512
- 公开号：
- JP5429447B2
- 申请日:
- 2008.10.29
- 申请国别(地区):
- JP
- 年份:
- 2014
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To provide a simple-structured optical tomographic image measuring apparatus applicable to the variation of individual probes in a wide range, and permitting easy adjustment for measurement.
SOLUTION: Even if the lengths of the light paths of measuring light L1 and reflection light L3 vary because of the variation in the length of the respective probes 10 when a plurality of probes 10 are replaced and used, any tomographic images can be quickly and easily captured only by minutely adjusting the length of the light path of an optical path sequence OPS integrally because a plurality of tomographic signals are generated from a subject S for measurement in this embodiment.
COPYRIGHT: (C)2010,JPO&INPIT
- 来源网站：
- 中国工程科技知识中心
