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SYSTÈMES ET PROCÉDÉS DE MESURE OPTIQUE AVEC AJUSTEMENTS D'ABERRATION CHROMATIQUE PERSONNALISÉS
专利权人:
Amo Wavefront Sciences; LLC
发明人:
申请号:
EP16782165.1
公开号:
EP3355759B1
申请日:
2016.09.30
申请国别(地区):
EP
年份:
2019
代理人:
摘要:
An optical measurement system method for measuring a characteristic of a subject's eye use a probe beam having an infrared wavelength in the infrared spectrum to measure a refraction of the subject's eye at the infrared wavelength; capture at least two different Purkinje images at two different corresponding wavelengths from at least one surface of the lens of the subject's eye; determine from the at least two different Purkinje images a value for at least one parameter of the subject's eye; use the value of the at least one parameter to determine a customized chromatic adjustment factor for the subject's eye; and correct the measured refraction of the subject's eye at the infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the subject's eye at a visible wavelength in the visible spectrum.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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