眼科用検査装置
- 专利权人:
- 国立大学法人山梨大学
- 发明人:
- 柏木 賢治,中山 淳二
- 申请号：
- JP2008072217
- 公开号：
- JP4878604B2
- 申请日:
- 2008.03.19
- 申请国别(地区):
- JP
- 年份:
- 2012
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To provide an ophthalmologic examination apparatus capable of quantitatively measuring the shape of an iris.
SOLUTION: The ophthalmologic examination apparatus comprises a slit light projecting optical system 70 for projecting a slit light to the anterior ocular part of the eye to be examined from the pupil to the periphery of the iris, a driving device 44 for moving and controlling the slit light projecting optical system so as to perform scanning with the slit light to be projected by the slit light projecting optical system 70, a photographing optical system 80 for photographing, a plurality of times, a cross-sectional image of the anterior ocular part resulting from reflected light of the slit light projected by the slit light projecting optical system 70, in response to the movement of the slit light, and a data analyzing section 45 for performing: a step for analyzing the cross-sectional image photographed by the photographing optical system 80 so as to calculate depth of the anterior chamber at the plurality of positions of the eye to be examined a step for calculating plurality of position coordinates on the surface of the iris, based on the plurality of calculated depth of the anterior chamber and a step for calculating the curvature radius of the iris, based on the plurality of calculated position coordinates.
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- 来源网站：
- 中国工程科技知识中心
