A kind of optical coherence tomoscanning device,Including one first light path mould group,One second light path mould group,One third light path mould group,And one light path calculate mould group,By the second light path mould group,The optical path difference of the reference beam and sample beam of putting sample can once be measured and do not put the reference beam of sample and the optical path difference of sample beam,Therefore can while measuring thickness of sample,The refractive index of sample is measured,Substantially shorten so that measuring the time,In addition,The phase difference of pi/2 is generated when polarizing film and quarter-wave plate can make reference beam and sample beam be reflected back spectroscope,Moving algorithm and Fourier transform by item can eliminate from noise peak value caused by interference phenomenon and mirror image phenomenon,And then increase the measuring range of thickness of sample.一種光學同調斷層掃描裝置，包括一第一光程模組、一第二光程模組、一第三光程模組、及一光程計算模組，藉由第二光程模組，即可一次測得有擺放樣品的參考光束及樣品光束的光程差與未擺放樣品的參考光束及樣品光束的光程差，因此可在量測樣品厚度的同時，測得樣品的折射率，使得量測時間大幅縮短，此外，偏振片及四分之一波片可使參考光束與樣品光束反射回分光鏡時產生π/2的相位差，藉由項移演算法及傅立葉轉換可消除自相干涉現象及鏡像現象所造成的雜訊峰值，進而增加樣品厚度的量測範圍。
