The invention relates to a method for obtaining a sub-resolution image of a specimen (52) using a microscope (100), the method comprising:projecting an illumination pattern of illumination light onto the specimen (52), thereby illuminating the specimen (52)detecting at least a portion of fluorescent light emitted from the specimen (52) and/or detecting at least a portion of illumination light reflected from the specimen (52), thereby capturing a series of images of the specimen (52) at a plurality of different relative positions of the specimen (52) with respect to the illumination pattern projected onto the specimen (52), wherein between the capturing of at least two images of the series the relative position of the specimen (52) with respect to the illumination pattern projected onto the specimen (52) is shifted in a non-controlled mannerprocessing the captured images to extract a sub-resolution image of the specimen (52).The invention relates further to a large distance microscope (100) for fluorescence and/or reflection illumination observations of a specimen (52), a computer implemented method for generating sub-resolution images of a specimen (52) based on a plurality of raw images of the specimen (52) obtained by a microscope (100), and a corresponding computer program product.
