A surface profile measuring apparatus LMS includes a measuring head 25 having therein a distance detector and an angle detector, a workstage unit 10 configured to move an object under measurement W, a head stage unit 30 configured to swing the measuring head 25, and a controller 50 configured to control operations of the units. A first probe light beam provided by the distance detector and a second probe light beam provided by the angle detector are configured to be both obliquely incident on a surface under measurement. The controller 50 moves the measuring head 25 and the object under measurement W relative to each other in such a manner that the applied positions of the first and second probe light beams move along a measurement line and derives the profile of the surface under measurement along the measurement line based on the distance to the surface under measurement detected by the distance detector 21 and the angle of the surface under measurement detected by the angle detector 22.
