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SCAN ABUTMENT FOR A DENTAL IMPLANT HAVING REDUCTION OF THE FIT CLEARANCE
专利权人:
发明人:
Matthias FUNK
申请号:
US15771428
公开号:
US20180344432A1
申请日:
2016.10.26
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The invention relates to a scan abutment (2), in particular an integrally manufactured scan abutment, for determination of the position of the front face (1.1) of a dental endosseous implant (1), wherein the abutment (2) has a longish, hollow shaft (4), and the shaft has an upper region (4.1), a central region (4.2) and a lower region (4.3). Moreover, the shaft (4) of the scan abutment with its central region (4.2) is attachable onto the front face (1.1) of the implant (1), and its lower region (4.3) is insertable into the connection geometry of the implant. The longish, hollow shaft (4) has a side wall (10). The shaft of the scan abutment has at least two to terminally extending slits (5) in its central region (4.2) and lower region (4.3) in the side wall (10). Two, three or four slits are preferred. Preferably, the slits (5) end in one recess (6) each, such as a circular recess, in the side wall (10) at their upper end and extend terminally in the side wall (10) to the bottom side of the shaft (4). Another subject matter of the invention is a kit comprising a scan abutment as well as the screw adjusted to the scan abutment or the bolt adjusted to the scan abutment.
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