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微小粒子の検査方法
专利权人:
株式会社住化分析センター
发明人:
寺田 健二,真家 信,中津 和弘
申请号:
JP20110098524
公开号:
JP6027724(B2)
申请日:
2011.04.26
申请国别(地区):
日本
年份:
2016
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a method for inspecting a material containing fine particles easily and accurately.SOLUTION: There is provided a method for inspecting variation in grain size of fine particles in an inspection object containing homogeneous fine particles, the method comprising the steps of: using a liquid in which the fine particles are dispersed in a solvent for electrophoresis using a separation medium which serves as a sieve; and inspecting variation in grain size of the fine particles from an electrophoretic pattern after the electrophoresis.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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