APPAREIL ET PROCÉDÉ DE SUPPORT DE DIAGNOSTIC ASSISTÉ PAR ORDINATEUR (CAD) BASÉ SUR LA VITESSE D'UNE SONDE

• 收藏
• 分享

专利权人:

Samsung Electronics Co.; Ltd

发明人:

申请号：

EP15174275.6

公开号：

EP2974665A1

申请日:

2015.06.29

申请国别(地区):

EP

年份:

2016

代理人:

摘要：

There is provided an apparatus for supporting Computer Aided Diagnosis (CAD) based on a speed of a probe. The apparatus includes a region of interest (ROI) detector configured to detect an ROI from a current image acquired from a probe； and an ROI classifier configured to determine whether to classify the ROI using a determined state of a speed, and classify the ROI according to a result of the determination.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/