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EDDY-CURRENT INSPECTION METHOD AND DEVICE
专利权人:
IHI Corporation
发明人:
TSUDA, Akinori,HATANAKA, Hiroaki,KAWAI, Hiroki
申请号:
EP20130752073
公开号:
EP2818856(B1)
申请日:
2013.02.15
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
An eddy-current flaw detection method includes a synchronization step (S3, S4) of synchronizing the phase of an exciting voltage applied by coil driving means to an exciting coil for generating an eddy current in a test object with the phase of a driving voltage, higher in frequency than the exciting voltage, applied by device driving means to a magnetoimpedance effect device for detecting the variation of a magnetic field arising in the exciting coil; and a magnetic field detection step (S5) of detecting the variation of the magnetic field arising in the exciting coil due to the eddy current generated in the test object using the magnetoimpedance effect device.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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