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CALIBRATION APPARATUS AND CALIBRATION METHOD
专利权人:
OLYMPUS CORPORATION
发明人:
ITO, RYOSUKE
申请号:
EP12833882
公开号:
EP2759246A4
申请日:
2012.09.20
申请国别(地区):
EP
年份:
2015
代理人:
摘要:
A calibration apparatus and a calibration method capable of executing a plurality of calibration items in one operation are provided. A reference reflection plate 43, which is arranged at a position away from a distal end portion of a measurement probe 3 by a predetermined distance L in a state in which the measurement probe 3 has been inserted in an insertion portion 41a, has a uniform reflectivity over a range of wavelength to be measured in an irradiation plane, and has stable reflection properties, is included, and a scattering mean free path of a material forming the reference reflection plate 43 is greater than a spatial coherence length Lsc determined using the predetermined distance L for the reference reflection plate 43.
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中国工程科技知识中心
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