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METHOD FOR EXAMINING AN OBJECT USING AN X-RAY RECORDING SYSTEM FOR PHASE CONTRAST IMAGING WITH DISPLACEMENT MEASUREMENT
专利权人:
发明人:
Gisela ANTON,Florian BAYER,Jürgen DURST,Thilo MICHEL,Georg PELZER,Jens RIEGER,Thomas WEBER
申请号:
US14488392
公开号:
US20150092915A1
申请日:
2014.09.17
申请国别(地区):
US
年份:
2015
代理人:
摘要:
A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.
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