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Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning
专利权人:
Siemens Aktiengesellschaft
发明人:
Gisela Anton,Florian Bayer,Jürgen Durst,Thilo Michel,Georg Pelzer,Jens Rieger,Thomas Weber
申请号:
US14488379
公开号:
US09500602B2
申请日:
2014.09.17
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.
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